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IVPS 100
Tip characterizers for radius and slope                             

Pitch standard

Array of  5 silicon lines with vertical, paralell sidewalls (111-crystal planes)

Linewidth: 100 nm
(actual linewidth is delivered for each chip)

Pitch: 500 nm ± 10nm

Depth:  ~ 900 nm

Surface/sidewall  angle: 90° ± 0.5°

Sidewall parallelity:      < 0.4°

Top corner radius:       < 10 nm

Well suited also as SEM standard
 
IVPS100
 IVPS100 Pitch



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